Ground state electron energies in sp3 hybridized Si and C atoms in 4H-SiC calculated from Ionization energies
Keywords:
Bandgaps, Ionization, 4H-SiC, Composite semiconductor materialsAbstract
In this research article, the ionization electron energies of sp3 hybridized Si and C atoms in 4H-SiC are calculated. The Si and C atoms are bonded tetrahedrally in 4H-SiC. The potential energy difference is found to be 0.13 eV from the ionization energies. The minimum number of Si-C bilayers are further calculated as 25 in 4H-SiC to give a theoretical bandgap of the bulk material as 3.25 eV, very close to the value of 3.26 eV calculated by applying the density functional theory.
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Published
18-08-2023
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